Author(s)

Lirong Wang

Corresponding Author

Lirong Wang

Abstract

With the progress and development of management science, the way of production management and improvement in modern factories increasingly depends on the management strategy of equipment comprehensive efficiency. In the automotive industry and electronic industry, equipment integrated efficiency strategy has been widely used, while in the management of integrated circuit semiconductor test equipment, the related research on equipment integrated efficiency level is relatively small. This paper mainly introduces the relative advantages of the integrated efficiency management strategy of equipment. At the same time, based on the three indicators of the integrated equipment management strategy, namely, time crop rate, performance crop rate and yield rate, are used as evaluation indicators in the management of integrated circuit semiconductor test equipment. Practice shows that the equipment comprehensive efficiency proposed in this paper has been applied to IC semiconductor testing to improve efficiency and provide a scientific management method for enterprise industry change.

Keywords

Management Science; Equipment Comprehensive Efficiency; Integrated Circuit Semiconductor Testing Equipment; Cost and Efficiency; Industrial Change